Ennostar (stock code 7728), a photonic chip testing equipment manufacturer, reported October revenue of NT$51.504 million, representing a 71.33% year-over-year increase and marking a historical high for the same period. The company has maintained revenue above NT$50 million for two consecutive months. On November 3-4, Ennostar CEO and CTO Liao Hua-hsien presented the company's NightJar silicon photonics wafer optical loss detection technology at the PIC Summit Europe in the Netherlands, followed by a presentation at the SWTest Asia international wafer testing symposium on November 5. The revenue growth is attributed to rising demand from AI data centers, high-speed optical communications, and co-packaged optics (CPO) applications. Ennostar is advancing its self-developed NightJar detection equipment to extend optical loss analysis from traditional failure localization to wafer-level screening, targeting the silicon photonics mass production testing market.
Ennostar Reports 71.33% October Revenue Growth
Ennostar announced October consolidated revenue of NT$51.504 million, a 71.33% year-over-year increase. Cumulative revenue for the first ten months reached approximately NT$372 million, up 44.63% compared to the same period last year. The company's quarterly performance showed sequential growth: first quarter revenue totaled approximately NT$100 million, second quarter NT$108 million, and third quarter NT$113 million. Third quarter revenue increased 77.24% year-over-year.
Liao Hua-hsien Presents NightJar Technology at European and Asian Conferences
Ennostar CEO and CTO Liao Hua-hsien delivered presentations on NightJar wafer optical loss detection technology at two international events. On November 3-4, he spoke at the PIC Summit Europe 2026 in the Netherlands. On November 5, he presented at the SWTest Asia 2026 international wafer testing symposium. The presentations emphasized the technology's shift from failure analysis to mass production screening, enabling customers to identify defective dies in advance.
NightJar Achieves 60x Speed Improvement in Wafer Optical Loss Detection
The NightJar system addresses cost challenges in silicon photonics and CPO packaging by detecting defects before backend assembly. Traditional insertion loss (IL) measurements capture overall optical loss but cannot pinpoint anomaly locations. NightJar uses hyperspectral imaging to convert optical loss into images containing position, wavelength, and power information. The system identifies waveguide and coupling structure anomalies while distinguishing between optical path leakage and electrical luminescence, covering both optical and electrical failure analysis.
Liao Hua-hsien stated that NightJar offers advantages in localization, quantification, and characterization. For testing 64 dies, traditional methods require approximately 123 minutes, while NightJar completes the process in 121 seconds—a speed improvement of approximately 60 times. Die comparison results demonstrate high consistency, facilitating integration into high-throughput wafer testing.
Ennostar Plans Wafer Acceptance Testing Integration
Ennostar is planning to integrate NightJar into wafer acceptance testing (WAT) and other front-end processes. The implementation will establish optical loss distribution maps for entire wafers. Combined with existing test data, the system will perform die risk classification, helping customers determine which dies can proceed to subsequent processes, require re-inspection, or should be eliminated early. This approach aims to reduce unnecessary packaging and testing costs.
FAQ
What revenue did Ennostar report for October?
Ennostar reported October consolidated revenue of NT$51.504 million, representing a 71.33% year-over-year increase and a historical high for the same period. The company maintained revenue above NT$50 million for two consecutive months.
How much faster is NightJar compared to traditional testing methods?
For testing 64 dies, traditional methods require approximately 123 minutes, while NightJar completes the process in 121 seconds. This represents a speed improvement of approximately 60 times, according to CEO Liao Hua-hsien.
Where did Ennostar present its NightJar technology?
Ennostar CEO Liao Hua-hsien presented NightJar wafer optical loss detection technology at the PIC Summit Europe 2026 in the Netherlands on November 3-4, and at the SWTest Asia 2026 international wafer testing symposium on November 5.
